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92
Mots clés
Al2O3
Ion beam analysis
Measurement
Zinc oxide
Evaluation
Nanoparticles
Interface defects
Ageing
Silicon Carbide
Passivation
Gold
Ferromagnetic resonance
Metal-insulator transition
Nitridation
Low energy electron diffraction LEED
Magnetic semiconductors
Alloy
Raman spectroscopy
Magnetization curves
NRP
EPR
Nuclear resonance profiling NRP
Alloys
Aluminium
Acoustic
2H
Atomic Layer Deposition ALD
Charge exchange
7550Ee
Acoustic propreties of solid
Topological defects
Oxidation
AC susceptibility
X-ray diffraction
PIXE
17Op
Sputtering
Kossel diffraction
Aluminum
Nanostructures
27Alda
Density functional theory
8140Ef
Rutherford backscattering spectrometry RBS
Adsorption Isotherms
Pb centers
Photoluminescence
Energy loss
17Opp
Nickel
Adsorbed layers
Epitaxy
Adsorption
Periodic multilayer
17O
Topological insulators
Silica
Nuclear reaction analysis
SiC
Thin films
Growth
Auger electron spectroscopy AES
Stable isotopic tracing
Ion implantation
Magnetic anisotropy
Capillary condensation
ADSORPTION DESORPTION HYSTERESIS
18O
7630Lh
XPS
6855Jk
Annealing
Indium oxide
13C
ALD
Multilayer
Defects
GaMnAs
Diffusion
27Ald p&α
AFM
XRD
Silicon carbide
Isotopic Tracing
3C-SiC
Silicon
Pulsed laser deposition
7550Pp
Channeling
18O resonance
Thin film
RBS
Oxygen deficiency
15N
Epitaxial growth
Hysteresis
HfO2
Transparent conductive oxide TCO
27Aldp
Gallium oxide