Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis - Université de Lille Accéder directement au contenu
Article Dans Une Revue Microscopy and Microanalysis Année : 2015

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hal-04433866 , version 1 (02-02-2024)

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David Rossouw, Pierre Burdet, Francisco de la Peña, Caterina Ducati, Benjamin R. Knappett, et al.. Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis. Microscopy and Microanalysis, 2015, Microscopy and Microanalysis, 21 (S3), pp.1227-1228. ⟨10.1017/s1431927615006923⟩. ⟨hal-04433866⟩
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