Structural evolution and charge storage mechanism of sputtered LiMn15Ni1;5O4 thin films by X-ray diffraction and Raman spectroscopy - Université de Lille Accéder directement au contenu
Communication Dans Un Congrès Année : 2022

Structural evolution and charge storage mechanism of sputtered LiMn15Ni1;5O4 thin films by X-ray diffraction and Raman spectroscopy

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Chimie
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Dates et versions

hal-04304410 , version 1 (24-11-2023)

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  • HAL Id : hal-04304410 , version 1

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Ankush Bhatia, Clement Leviel, Maxime Hallot, Jean Pierre Pereira-Ramos, Christophe Lethien, et al.. Structural evolution and charge storage mechanism of sputtered LiMn15Ni1;5O4 thin films by X-ray diffraction and Raman spectroscopy. European Materials Research Society Spring meeting (EMRS 2022), May 2022, Visioconférence, France. ⟨hal-04304410⟩
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